Data Mining And Diagnosing Ic Fails (Frontiers In Electronic Testing, 31),Used Hancock Fesler Nearly 2 Decades Into A

Nearly 2 Decades Into A Hall Of Famebound Career

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Data Mining And Diagnosing Ic Fails (Frontiers In Electronic Testing, 31),Used Hancock Fesler Nearly 2 Decades Into AThis Book Grew Out Of An Attempt To Describe A Variety Of Tools That Were Developed Over A Period Of Years In Ibm To Analyze Integrated Circuit Fail Data. The Selection Presented In This Book Focuses On Those Tools That Have A Significant Statistical Or Datamining Component. The Danger Of Describing Sta Tistical Analysis Methods Is The Amount Of Nontrivial Mathematics That Is Involved And That Tends To Obscure The Usually Straigthforward Analysis